On-Demand Webinar: Mastering EVM: Performance Vs. Speed Tradeoffs
Production is always focused on test time. R&D cares most about accuracy. Characterization and design verification care about both. As standards like 5G and 802.11 grow, we find the number of test cases growing. In the past, we were able to characterize a part in a couple of days.
Now it could easily take weeks. Test time is becoming an important EVM test consideration. In this webinar, we explore how to optimize your measurement time in order to achieve your desired accuracy.
Title: Mastering EVM: Performance vs. Speed Tradeoffs
Duration: 1 hour
Speaker
Martin Lim
5G Component Technology Lead
Rohde & Schwarz USA, Inc.
Martin Lim is a national application engineer with Rohde & Schwarz. He brings with him 22 years of semiconductor, wireless, and RF test experience. Currently focused on mmWave 5GNR physical layer testing. Past projects include 5GNR mmWave test system development; Envelope tracking; Amplifier (FEMiD) test; 802.11AC MIMO; Test Automation Speed & Radiated 5GNR.
Prior to joining R&S, he served as RF Characterization Manager at Nokia Mobile Phones. Martin was responsible for cellular Tx/Rx, GPS, and 802.11 test systems development. He received his B.S. in Electrical Engineering from California Polytechnic, Pomona.